Klocwork Insight Selected for VME and Critical Systems Editor’s Choice Award

SOURCE:

klocwork

2008-07-15 08:00:00

BURLINGTON, MA–(EMWNews – July 15, 2008) – Klocwork, Inc., the proven leader in automated source code analysis

solutions for improving software security and quality, today announced

Klocwork Insight received the VME and Critical Systems Editor’s Choice

Award. Klocwork Insight’s focus on delivering source code analysis for use

with mission-critical systems and its ability to reduce the amount of time

software developers spend debugging rather than writing code were primary

reasons for the selection.

The 2008 Editor’s Choice Awards will be published in the August 2008 issue

of VME and Critical Systems magazine. Editors highlighted numerous

ground-breaking developments brought to market with Klocwork Insight: “Of

particular importance is that this desktop tool is intended for use by the

developer during local build, instead of providing an after-the-fact audit

build report. The list of features is too numerous to describe here, but

highlights include: identification and analysis of critical and security

bugs (handy in mission-critical systems); IDE-based code analysis (no need

to exit your favorite tool); detailed software architecture visualization;

user-defined style or path analysis checkers; bug tracking and reporting —

locally or team-based.”

“We are impressed with the potential of Klocwork’s Insight,” said Chris

Ciufo, group editorial director, OpenSystems Publishing. “Any kind of tool

that contracts the iterative process of writing and debugging software —

especially if it can help during the coding part of the process — might be

a real money saver.”

“It is terrific for Klocwork Insight to be credited specifically for its

ability to deliver source code analysis directly to the developer desktop,”

said Mike Laginski, CEO, Klocwork. “Our focus has always been on enabling

developers of mission critical software to write higher quality, more

secure code and we are extremely pleased to be recognized for it.”

Klocwork Insight is a leading static source code analysis tool for C, C++

and Java, and the only solution with a Connected Desktop Analysis

capability that enables developers to run the analysis with full system

context right at their desktop, before they check in their code. Solutions

are available in two versions: Klocwork Insight for

C/C++ and Java and Klocwork Insight for Java.

About OpenSystems Publishing

OpenSystems Publishing has been a leading publisher of electronics

magazines, e-mail newsletters, websites, and product resource guides for

more than 20 years. OSP offers E-casts and Techcasts for engineers and

provides interactive tools where engineers can communicate directly with

presenters and top industry editors. Current publications include:

CompactPCI and AdvancedTCA Systems, DSP-FPGA.com, Embedded Computing

Design, Industrial Embedded Systems, Military Embedded Systems, PC/104 and

Small Form Factors, PXI Test & Technology, and VME and Critical Systems.

For more information, visit www.opensystems-publishing.com.

About Klocwork

Klocwork is an enterprise software company providing automated source code

analysis software products that automate security vulnerability and quality

risk assessment, remediation and measurement for C, C++ and Java software.

More than 250 organizations have integrated Klocwork’s automated source

code analysis tools into their software development process in order to

ensure their code is free of mission-critical flaws while freeing their

developers to focus on what they do best — innovate.

Contact Klocwork for more information at www.klocwork.com or

info@klocwork.com.

Klocwork and the Klocwork logo are registered trademarks of Klocwork,

Incorporated in the United States and/or other countries. All other names

are trademarks or registered trademarks of their respective companies.

Logo attributed to VME and Critical Systems Magazine. Copyright OpenSystems

Publishing, 2008. All rights reserved; used with permission.